Efficient Test Methodologies for High-Speed Serial Links

Efficient Test Methodologies for High-Speed Serial Links

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Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.Razavi B (2002) Design of integrated circuits for optical communications, McGraw-Hill, New York 24. Lee K. et al. ... Maxim Integrated Products (2004) Pattern Creator/Converter software User Manual, Application Note: HFAN-9.5.0, Available at www.maxim-ic.com 30. Oppenheim ... Tektronix (2006) TDS JIT3- Jitter Analysis and Timing Software. Available ... IEEE J Solid State Circuit 40(4): 1012a€“1026 43.


Title:Efficient Test Methodologies for High-Speed Serial Links
Author: Hong Dongwoo, Kwang-Ting Cheng
Publisher:Springer Science & Business Media - 2009-12-24
ISBN-13:

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