This report describes a manual procedure for minimizing the number of tests necessary to detect a single stuck-at fault in a large scale integrated circuit. (Author).This report describes a manual procedure for minimizing the number of tests necessary to detect a single stuck-at fault in a large scale integrated circuit. (Author).
Title | : | Manual Fault Detection Test Set Minimization |
Author | : | John Knaizuk (Jr), SYRACUSE UNIV N Y DEPT OF INDUSTRIAL ENGINEERING AND OPERATIONS RESEARCH. |
Publisher | : | - 1977 |
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