Successful transmission electron microscopy (TEM) experimentation depends on many things, one being specimen preparation. Whereas TEM samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk and/or other classes of materials creates a need for more specialized preparation methods. This volume, the 4th in a successful series from MRS, pioneers novel methods or ways of characterizing the specimen preparation process. Contributions to the volume are tutorial in nature, and therefore somewhat longer than usual. Papers cover both general and materials-specific specimen preparation methods. Metallic, polymer, plastic, semi-conducting, ceramic and magnetic materials as found in bulk, thin-film, dispersed and powdered forms are discussed.EXPERIMENTAL TECHNIQUES The advantage to the lift-out technique is that virtually no initial specimen ... A schematic diagram of the important aspects of the technique is illustrated in fig. ... Next a aquot;stair stepaquot; trench of total dimension of approximately 5 um wide x 30 um long x 5 um deep (at the deepest step) is sputteredanbsp;...
Title | : | Specimen Preparation for Transmission Electron Microscopy of Materials |
Author | : | Ron M. Anderson, Scott D. Walck |
Publisher | : | - 1997 |
You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.
Once you have finished the sign-up process, you will be redirected to your download Book page.
How it works: